Scanning Electron Microscope (Zeiss EVO MA10)


Zeiss EVO M10 SEM - imaging

Description

Multi-sample, medium resolution inspection SEM

Features

  • Thermal emission tungsten firing unit.
  • 200 V to 30 kV accelerating voltage.
  • 5 axis X, Y, Z, rotational, and tilt stage controls.
  • Solid state secondary electron detector and backscattered electron detector.
  • ~100 nm resolution, sample dependent.


Facebooktwittergoogle_pluslinkedinFacebooktwittergoogle_pluslinkedin