Alpha-Step IQ


Alpha-Step IQ

Description

Two-dimensional surface topography profiler with sub-8-angstrom step height repeatability and sub-angstrom resolution. Ideal for thin-film profilometry and measuring the step height of various materials.

Features

  • Extended vertical range to 2 mm
  • Increased magnification to 1300 × 1300 µm
  • Greater repeatability and reproducibility
  • Automatic levelling and multi-scan mode
  • Stylus, 5 µm radius


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