Alpha-Step IQ


Alpha-Step IQ - W1-062

Description

Two-dimensional surface topography profiler with sub-8-angstrom step height repeatability and sub-angstrom resolution. Ideal for thin-film profilometry and measuring the step height of various materials.

Features

  • Maximum vertical range: 2 mm
  • Maximum field of view: 1300 µm × 1300 µm
  • Excellent repeatability and reproducibility
  • Automatic levelling and multi-scan mode
  • Stylus radius: 5 µm


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