4D X-Ray Microscopy is Available.


In-situ analysis and deep learning segmentation

Choose the right techniques for multi-layer film analysis


Cross sectional analysis plays an important role in thin film characterization. Various techniques are available at the nanoFAB for compositional and morphological analysis of mutli-layer thin film stacks, including XPS Depth-Profiling, SEM/EDX, TEM/EDX. These techniques work complementarily to each other. It is important to choose the most suitable one(s) for your characterization needs. Here, we […]

Hitachi S4800 FESEM is Available


The nanoFAB is pleased to announce that a Hitachi S4800 FESEM has been fully commissioned and now is available for user training. The S4800 is equipped with a cold field-emission gun(c-FEG) and configured with various imaging detectors.   The Hitachi S4800 FESEM features: Resolution: 1 nm (SE @15 kV); 2 nm (SE @1 kV); 1.4 nm […]

Multi-Ion Beam FIB/SEM is Operational


TEM Sample Preparation and Advanced Ion Milling

Career Opportunities – Norcada Inc.


The nanoFAB is pleased to post the following career opportunity at Norcada for a MEMS Production Engineer. The details of the position including responsibilities, qualifications, experiences and education are listed in the below link. MEMS Production Engineer

Career Opportunities – Norcada Inc.


The nanoFAB is pleased to post the following career opportunity at Norcada for a Device Production & Qualification Technician.  The details of the position including responsibilities, qualifications, experiences and education are listed in the below link. Device Production & Qualification Technician

Career Opportunities – Norcada Inc.


The nanoFAB is pleased to post the following career opportunities at Norcada for an Applications Engineer and a Fabrication and Product Engineer.  The details of the positions including responsibilities, qualifications, experiences and education are listed in the below links. Applications can be submitted using the links below. Applications Engineer Fabrication and Product Engineer  

Winter 2022 Newsletter


  Winter 2022 Newsletter This email is provided as an update regarding ongoing activities within the nanoFAB which may be of interest to you. Hitachi S4800 FESEM Available A Hitachi S4800 cold field-emission (c-FEG) high resolution SEM is now fully commissioned and available for training. Tool specifications and sample data images are provided. Read and See More […]

New positive-tone EBL resist in stock: CSAR 62 (AR-P 6200)


CSAR 62 can be used as a cheaper alternative for ZEP520A.

nanoFAB Winter 2021 Shutdown Schedule


As we approach the end of another year, we would like to share our annual winter shutdown schedule. Please plan your access and work flows appropriately, as accommodations to this schedule will not be possible. Date    Activity Nov 29    Chemical Clean-up Deadline. Yellow stickers Dec 3    Last Day for sample submissions Dec […]

Multilevel deep etching in silicon


Fabricate designs with multilevel deep etched structures via DRIE