4D X-Ray Microscopy is Available.

In-situ analysis and deep learning segmentation

Choose the right techniques for multi-layer film analysis

Cross sectional analysis plays an important role in thin film characterization. Various techniques are available at the nanoFAB for compositional and morphological analysis of mutli-layer thin film stacks, including XPS Depth-Profiling, SEM/EDX, TEM/EDX. These techniques work complementarily to each other. It is important to choose the most suitable one(s) for your characterization needs. Here, we […]

New nanoFAB Characterization Staff

Meet the newest member of the nanoFAB Characterization Group

Career Oppontunity – Avalon Holographics

The nanoFAB is pleased to post the following career opportunity at Avalon Holographics for a Nanotechnologist. Please see the attachment below for further information and instructions on how to apply. Avalon Holographics – Nanotech_July 2022

Career Opportunity – Sheba Microsystems

Job posting for MEMS Process Engineer at Sheba Microsystems

New nanoFAB fabrication staff

Meet the newest members of the nanoFAB fabrication group

Structure zone model calculator

Predict the microstructure of sputtered films using our structure zone model calculator.

Spring 2022 Newsletter

    Spring 2022 Newsletter The nanoFAB is on LinkedIn. Follow us to stay up to date on our latest technical developments, news and connect to current and past colleagues. Stephanie Bozic Retiring After 20 years helping to train students and build the nanoFAB into what it is today, Stephanie Bozic has announced her retirement. She has […]

Stephanie Retirement Announcement

After 21 years, and as the first hire in the nanoFAB, Stephanie has announced her retirement. Her official last day will be June 30th. Stephanie has been one of the foundational members of the nanoFAB staff, helping to build the nanoFAB into what it is today. When Stephanie first started in the nanoFAB, there were a few wet […]

Lithography area upgrade

Major upgrade to core lithography tools