In-situ analysis and deep learning segmentation
Choose the right techniques for multi-layer film analysis
on April 25, 2022
Cross sectional analysis plays an important role in thin film characterization. Various techniques are available at the nanoFAB for compositional and morphological analysis of mutli-layer thin film stacks, including XPS Depth-Profiling, SEM/EDX, TEM/EDX. These techniques work complementarily to each other. It is important to choose the most suitable one(s) for your characterization needs. Here, we […]
New nanoFAB Characterization Staff
on August 4, 2022
Meet the newest member of the nanoFAB Characterization Group
Career Oppontunity – Avalon Holographics
on July 25, 2022
The nanoFAB is pleased to post the following career opportunity at Avalon Holographics for a Nanotechnologist. Please see the attachment below for further information and instructions on how to apply. Avalon Holographics – Nanotech_July 2022
Career Opportunity – Sheba Microsystems
on June 23, 2022
Job posting for MEMS Process Engineer at Sheba Microsystems
New nanoFAB fabrication staff
on June 16, 2022
Meet the newest members of the nanoFAB fabrication group
Structure zone model calculator
on June 8, 2022
Predict the microstructure of sputtered films using our structure zone model calculator.
Stephanie Retirement Announcement
on May 30, 2022
After 21 years, and as the first hire in the nanoFAB, Stephanie has announced her retirement. Her official last day will be June 30th. Stephanie has been one of the foundational members of the nanoFAB staff, helping to build the nanoFAB into what it is today. When Stephanie first started in the nanoFAB, there were a few wet […]