Alpha-Step IQ – W1-040

Alpha-Step IQ - L2-128


Two-dimensional surface topography profiler with sub-8-Å step height repeatability and sub-Å resolution. Ideal for thin-film profilometry and measuring the step height of various materials. Your thin Film must has a step on it in order to measure.


  • Extended vertical range to 2 mm
  • Increased magnification to 1300 µm × 1300 µm
  • Greater repeatability and reproducibility
  • Automatic levelling and multi-scan mode
  • Stylus: 5 µm radius