Materials Characterization

characterization | featured | news

Advanced XRD techniques and applications on Bruker D8D plus diffractometer

Non-Coplanar Scan, Pole Figure, 2D Stress Measurement, and Multi-Angle Scattering

Xuehai Tan
2024-10-01
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characterization | featured

Correlative imaging workflow available on SEM/FIB

The nanoFAB is pleased to announce successful configuration and implementation of software solutions in our electron and ion microscopy, enabling large area imaging and correlative workflow.

Peng Li
2024-06-10
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A magnifying glass focuses on a textured surface with circular insets labeled AFM, SEM, TEM, and EDX, each showcasing unique patterns and colors. The intricate details highlight the power of correlative imaging to unravel complex structures.
characterization | featured

Advanced TEM Sample Preparation

The ThermoFisher Helios Hydra Plasma FIB offers advanced, damage-free TEM lamella preparation with enhanced flexibility and high throughput for various materials.

Peng Li
2023-10-19
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characterization | featured

SAXS, GI-SAXS/WAXS are available on Bruker D8D+

The nanoFAB now offers fully commissioned SAXS and GI-SAXS/WAXS techniques on the Bruker D8 DISCOVER Plus X-Ray Diffractometer for user training and sample analysis.

Xuehai Tan
2023-09-21
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characterization | featured | news

Broad Ion Beam (BIB) polishing for SEM/EDX/EBSD

Automatic, unattended process for large area preparation.

Peng Li
2023-06-03
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characterization | featured | news

In-situ heating S/TEM is available

The in-situ heating TEM analysis is now available to all users.

Xuehai Tan
2023-03-20
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characterization | news

Bruker D8D plus XRD-SAXS is Operational

Heating & Biasing; Imaging, Diffraction and EDX

Xuehai Tan
2023-03-05
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characterization | news

Auto Slice & View (ASV) fully commissioned

Fully automatic FIB/SEM tomography

Peng Li
2023-01-10
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characterization | news

New nanoFAB Characterization Staff

Meet the newest member of the nanoFAB Characterization Group

Peng Li
2022-12-03
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characterization | news

XPS analysis of air-sensitive materials

XPS analysis for air-sensitive materials using a specialized transfer vessel to minimize air exposure.

Peng Li
2022-11-10
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Industrial machinery with metal components and pipes, showing a close-up of a labeled transfer vessel. Inset graph with curved lines and peaks below.
characterization | fabrication | news

Spin Mill with Plasma FIB

Large-area planar sample preparation

Peng Li
2022-08-21
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characterization | featured | news

nGauge AFM is now Available at nanoFAB

AFM by 3 easy steps: Sweep, Approach, and Scan.

Nastaran Yousefi
2022-05-22
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Close-up of a nGauge AFM microscope examining a small rectangular sample on a metallic stage, illuminated under a focused light.
characterization

4D X-Ray Microscopy is Available.

The nanoFAB has successfully commissioned the in-situ testing stage on the Zeiss Xradia Versa 620 X-Ray Microscope, offering advanced mechanical and thermal testing capabilities with enhanced segmentation and deep learning algorithms for superior in-situ analysis.

Peng Li
2022-05-19
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characterization

X-Ray Microscopy/nanoCT is Available

The nanoFAB is excited to announce the successful installation of the Zeiss ZEISS Xradia Versa 620 X-Ray Microscope, now fully operational for high-resolution, non-destructive 3D microstructure analysis across a variety of fields.

Peng Li
2021-08-09
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A person wearing glasses and blue gloves examines equipment in a laboratory setting.
characterization

Advanced XPS Capabilities Are Available

The nanoFAB is pleased to announce that the new PHI VersaProbe III (VP3) Scanning XPS Microprobe has been fully commissioned and all advanced capabilities are open to general access now.

Peng Li
2021-08-09
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