characterization | featured | news
Non-Coplanar Scan, Pole Figure, 2D Stress Measurement, and Multi-Angle Scattering
Read Post

characterization | featured
The nanoFAB is pleased to announce successful configuration and implementation of software solutions in our electron and ion microscopy, enabling large area imaging and correlative workflow.
Read Post

characterization | featured
The ThermoFisher Helios Hydra Plasma FIB offers advanced, damage-free TEM lamella preparation with enhanced flexibility and high throughput for various materials.
Read Post

characterization | featured
The nanoFAB now offers fully commissioned SAXS and GI-SAXS/WAXS techniques on the Bruker D8 DISCOVER Plus X-Ray Diffractometer for user training and sample analysis.
Read Post

characterization | featured | news
Automatic, unattended process for large area preparation.
Read Post

characterization | featured | news
The in-situ heating TEM analysis is now available to all users.
Read Post

characterization | fabrication | news
Large-area planar sample preparation
Read Post

characterization | featured | news
AFM by 3 easy steps: Sweep, Approach, and Scan.
Nastaran Yousefi
2022-05-22
Read Post
