Keithley 4200-Semiconductor Characterization System (SCS Analyzer)


Keithley 4200-Semiconductor Characterization System (SCS Analyzer)

Description

The Keithley 4200-Semiconductor Characterization System (SCS Parameter Analyzer) (with probe station) provides electrical characterization of materials, semiconductor devices, and processes.

Features

  • I-V & C-V measurement sweeps
  • Advanced ultrafast pulsed I-V measurements
  • Waveform capture
  • Transient I-V measurements
  • Used with a Signatone WL-1160 probe station


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