- New TEM is Operational
February 28, 2017
JEM-ARM200F Atomic Resolution S/TEM is operational. - Enhanced fabrication and characterization with Ga-FIB.
January 30, 2017
The Ga-FIB is open to user training now. - nanoFAB microscopy seminar: How to Make Small Things Look Big
November 28, 2016
The nanoFAB invites you to a microscopy seminar – “How to Make Small Things Look Big”. We… - nanoFAB Seminar: Low Energy Ion Scattering (LEIS) for the quantitative analysis of the outer atomic layer
October 24, 2016
The nanoFAB invites you to a characterization seminar. - Upgraded Zeiss Sigma FESEM: chamber/sample cleaning and film thickness measurement.
May 30, 2016
The Zeiss Sigma FESEM at the nanoFAB has recently been upgraded with the following new capabilities: (1)… - MSC/nanoFAB Advanced Microscopy workshops (June 9 and 10, 2016).
May 30, 2016
The nanoFAB, Zeiss and Oxford will be organizing two microscopy workshops during the 2016 Microscopic… - Helium Ion Microscopy of Insulating Materials.
December 9, 2015
The nanoFAB is pleased to announce that direct imaging of insulating materials is now available to our user… - Enhanced Electron Microscopy
December 9, 2015
The nanoFAB has recently completed the first of three installations intended to bolster its Electron Microscopy capabilities.… - Happy New Year – The Helium Ion Microscope is Up and Running!
January 1, 2015
The Zeiss Orion Helium Ion Microscope (HiM) has been successfully installed at the nanoFAB. The Helium Gas… - Electron Microscopy Workshop, Nov. 5 & 6, 2014 (UPDATED: online demo signup form).
October 20, 2014
The nanoFAB is pleased to be organizing a Microscopical Society of Canada (MSC) electron microscopy (EM) workshop, jointly with…