- Choose the right techniques for multi-layer film analysis
April 25, 2022
Cross sectional analysis plays an important role in thin film characterization. Various techniques are available at the… - Hitachi S4800 FESEM is Available
January 2, 2022
The nanoFAB is pleased to announce that a Hitachi S4800 FESEM has been fully commissioned and now… - Multi-Ion Beam FIB/SEM is Operational
October 8, 2021
TEM Sample Preparation and Advanced Ion Milling - Advanced XPS Capabilities Are Available
August 9, 2021
Imaging, Micro-Probing, Depth Profiling and Heating/Cooling XPS - X-Ray Microscopy/nanoCT is Available
August 9, 2021
Non-destructive, high throughput, high resolution 3D imaging - Confocal Raman Microscopy now available to users
April 30, 2021
Raman Spectrometry & 2D/3D mapping - Transmission EBSD is Available.
October 22, 2020
High Resolution Diffraction Analysis in SEMs - Free Full Access to the Oxford Aztec Suite.
April 28, 2020
Offline License for Oxford EDX and EBSD processing. - Seeing Atoms Has Never Been This Easy.
November 6, 2019
With Spherical Aberration (Cs) corrected STEM probe. - FLUXiM PAIOS system is open for training.
August 3, 2019
A platform for all-in-one characterization of solar cells and OLEDs