- Advanced TEM Sample Preparation
October 19, 2023
Ga free, low damage, versatile and high throughput - Broad Ion Beam (BIB) polishing for SEM/EDX/EBSD
June 3, 2023
Automatic, unattended process for large area preparation - New nanoFAB Characterization Staff
February 28, 2023
Meet the newest member of the nanoFAB Characterization Group - Auto Slice&View (ASV) fully commissioned
January 10, 2023
Fully automatic FIB/SEM tomography - New nanoFAB Characterization Staff
December 3, 2022
Meet the newest member of the nanoFAB Characterization Group - XPS analysis of air-sensitive materials
November 10, 2022
Sample transferred from glove box to analytical chamber - The nanoFAB is hiring
September 28, 2022
Characterization Applications/Research Specialist - Spin Mill with Plasma FIB
August 21, 2022
Large-area planar sample preparation - New nanoFAB Characterization Staff
August 4, 2022
Meet the newest member of the nanoFAB Characterization Group - 4D X-Ray Microscopy is Available.
May 19, 2022
In-situ analysis and deep learning segmentation