The nanoFAB is pleased to announce that direct imaging of insulating materials is now available to our user community – this is one of the unique capabilities of the newly installed Zeiss Orion Helium Ion Microscope (HiM). Preliminary results obtained by our microscopy team during the commissioning of this imaging technique have revealed previously unseen surface structures of insulating materials without the use of any anti-charging coatings.
Below are some examples of specimens varying from biological, to geological, to nanocomposite; all of these materials are completely insulating. Typical FESEM images of each sample are presented for comparison.
If you are interested in HiM imaging please contact Peng Li (email@example.com), the nanoFAB Characterization Group Leader for further information.