- IBSS Chiaro Plasma Contamination Control System.
May 14, 2019
SEM, TEM sample cleaning and surface modification - 2nd Alberta JEOL TEM User Meeting.
April 17, 2019
(Protochips) In-Situ Electron Microscopy Workshop - In-situ Heating XRD now available
April 16, 2019
Bruker D8 Discover XRD system - nanoFAB Public Seminar (April 3rd, 2019)
March 18, 2019
micro-CT and Plasma FIB-SEM Dual Beam (ThermoFisher) - nanoFAB Public Seminar
February 24, 2019
Nano-CT (Bruker) and FIB-SEM Dual Beam (Tescan) - Advanced Ion Milling Enhances Sample Preparation for Electron Microscopy.
October 23, 2018
Leica EM RES102 Ar Ion Milling System. - Advanced Microscopy for Aqueous and Insulating Materials
July 2, 2018
Freeze drying and Variable Pressure SEM/EDX. - Large Area Characterization Techniques.
March 5, 2018
Although advanced microscopy techniques are achieving very high spatial resolution (i.e. sub-nm), there has been great demand… - JEOL ARM S/TEM is now open for user training.
August 18, 2017
User training and staff analysis - New Leica Coater Enhances Microscopy.
May 29, 2017
Au/Pd film, Carbon film and Glow Discharge.