nanoFAB Public Seminar


As part of our new equipment purchases, the nanoFAB centre at the University of Alberta cordially invites you to attend an advanced microscopy seminar, evaluating the features of Nano-CT and FIB-SEM Dual Beam systems. Drs. Phil Salmon (Bruker) and Stefano Rubino (Tescan/Soquelec) will present Bruker Skyscan Nano-CT and Tescan FIB-SEM Dual Beam technologies and their applications in Material and Life Science.

Light refreshments will be provided prior to the seminar.

Time: 9:30-11:30am
Date: Friday, March 1st, 2019
Location: ETLC East Solarium (2nd floor)

Please register to confirm your attendance.

If you have any questions, please contact:

Peng Li, nanoFAB (