As part of our new equipment purchases, the nanoFAB centre at the University of Alberta cordially invites you to attend an advanced microscopy seminar, evaluating the features of Nano-CT and FIB-SEM Dual Beam systems. Drs. Phil Salmon (Bruker) and Stefano Rubino (Tescan/Soquelec) will present Bruker Skyscan Nano-CT and Tescan FIB-SEM Dual Beam technologies and their applications in Material and Life Science.
Light refreshments will be provided prior to the seminar.
Time: 9:30-11:30am
Date: Friday, March 1st, 2019
Location: ETLC East Solarium (2nd floor)
Please register to confirm your attendance.
If you have any questions, please contact:
Peng Li, nanoFAB (Peng.Li@ualberta.ca)
