News
The is the catch all News category. All of our posts can be found under news; however, they are further categorized for ease of use.
4D X-Ray Microscopy is Available.
May 19, 2022
In-situ analysis and deep learning segmentationCareer Opportunities – Norcada Inc.
March 9, 2022
The nanoFAB is pleased to post the following career opportunity at Norcada for a MEMS Production Engineer.…Career Opportunities – Norcada Inc.
March 8, 2022
The nanoFAB is pleased to post the following career opportunity at Norcada for a Device Production &…Career Opportunities – Norcada Inc.
February 8, 2022
The nanoFAB is pleased to post the following career opportunities at Norcada for an Applications Engineer and…Choose the right techniques for multi-layer film analysis
January 25, 2022
Cross sectional analysis plays an important role in thin film characterization. Various techniques are available at the…New positive-tone EBL resist in stock: CSAR 62 (AR-P 6200)
January 25, 2022
CSAR 62 can be used as a cheaper alternative for ZEP520A.Hitachi S4800 FESEM is Available
January 2, 2022
The nanoFAB is pleased to announce that a Hitachi S4800 FESEM has been fully commissioned and now…nanoFAB Winter 2021 Shutdown Schedule
November 5, 2021
As we approach the end of another year, we would like to share our annual winter shutdown…Multilevel deep etching in silicon
October 8, 2021
Fabricate designs with multilevel deep etched structures via DRIEMulti-Ion Beam FIB/SEM is Operational
October 8, 2021
TEM Sample Preparation and Advanced Ion Milling