New nanoFAB Characterization Staff

The nanoFAB is pleased to announce a new Applications/Research Specialist staff member – Dr. Xuehai (Mike) Tan in our Characterization group.

A senior user of the JEOL ARM TEM, Xuehai is a material research professional/engineer with many years of experience in novel and innovative characterization techniques of electrocatalysis and battery electrode materials, including Single-Atom Electron Microscopy, in-situ Electrochemical Microscopy, X-Ray Diffraction and Synchrotron X-Ray Spectroscopy.

Xuehai’s primary areas of responsibility are Electron, X-ray Microscopy and Spectroscopy, including TEM, XRM, XRD and Raman. He will be working to support user training, fee-for-service work and process development. He is more than happy to help the researchers achieve their material characterization goals. Challenge him with technical difficulties and barriers you encounter in your research!

Please join us in welcoming Xuehai!

Dr. Xuehai Tan in the JEOL JEM Atomic Resolution ARM 200cf S/TEM lab.