Archives for May 2016
- Upgraded Zeiss Sigma FESEM: chamber/sample cleaning and film thickness measurement.
May 30, 2016
The Zeiss Sigma FESEM at the nanoFAB has recently been upgraded with the following new capabilities: (1)… - MSC/nanoFAB Advanced Microscopy workshops (June 9 and 10, 2016).
May 30, 2016
The nanoFAB, Zeiss and Oxford will be organizing two microscopy workshops during the 2016 Microscopic… - Spin-coating Crystalbond
May 25, 2016
Using spin-coated Crystalbond provides a consistent, repeatable method to mount specimens to carrier wafers for subsequent plasma… - ZEISS Microscopy Webinar
May 6, 2016
The nanoFAB is pleased to share the following and invites you to attend: Webinar: ZEISS Microscopy Webinar:…