Happy New Year Newsletter

The nanoFAB would like to highlight some of our work that you might find interesting or beneficial to you in 2023. Follow us on LinkedIn, to stay up to date on our latest technical developments, news and connect to current and past colleagues.

Atomic Layer Deposition

The new Atomic Layer Deposition (ALD) system is now fully operational and available for training. You can review the performance of the various oxide and nitride films that are available on our process information page. Read more for additional links to the system features and details.

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High Resolution 3D Tomography

FIB/SEM tomography is has been fully commissioned on the Helios Hydra Plasma dual beam system. This serial sectioning technique provides high-resolution 3D volume analysis. Thank you to the various research groups for donating their samples for the team to develop this technique. Learn about the technique and watch the videos. Read and see more

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XPS Air-Sensitive Material Analysis

Through our continued development of analysis techniques, we can now offer air-sensitive XPS materials analysis. Review the data analysis and results for air sensitive materials. This is now fully available to general users. Read more

New nanoFAB Staff

The nanoFAB would like to introduce Dr. Nastaran (Nas) Yousefi as our newest Application/Research Specialist. Dr. Yousefi’s areas of responsibility will include XRM, XRD/SAXS and electrical characterization/test tools. Get to know Dr. Yousefi.

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Funding Opportunities

As an academic researcher utilizing the nanoFAB, you can reduce your research costs by applying for the CMC Microsystems MNT Awards. Successful applicants receive 80% of eligible nanoFAB costs.
Applications are accepted monthly.
NSERC Alliance Grant holders are eligible automatically.