Accurate optical constants and thickness for one’s films can be measured via variable angle spectroscopic ellipsometry (VASE), using either of the nanoFAB’s J.A. Woollam ellipsometery tools, but this technique is much slower than the Filmetrics, particularly if a uniformity map is desired. A good workflow is therefore to perform VASE on a film, then import the optical constants into the Filmetrics material library, which can then be used to obtain fast, accurate thickness measurements. Unfortunately, the native material file format output by the WVASE32 software cannot directly be read by the version of Filmetrics software available in the cleanroom.
To overcome this problem, the nanoFAB has developed a web app to convert WVASE32 .mat files into the .nnn and .kkk files required by the Filmetrics FILMeasure and FILMapper applications. Use the online form to choose a material category (metal, dielectric, etc.) and upload your .mat file; upon submission, the data is plotted and the converted optical constants (.nnn and .kkk files) are made available for download, and can be added to the Filmetrics material library. The web app is accessible both externally and to networked computers on nanoFAB tools, and the links to the converted files are accessible for at least 24 hours after submission.
We hope that our user community will find this web app helpful, to improve the accuracy and efficiency of thin-film characterization measurements.
For more information, please contact Aaron Hryciw.
Links
- Online VASE to Filmetrics conversion: toolbox.nanofab.ualberta.ca/vase2film