Articles & News

All
career-opportunities | featured | news

Career Opportunity - Applied NanoTools Inc

The nanoFAB is pleased to post the following Cleanroom Process Engineer/Scientist career opportunity at Applied NanoTools Inc.

2025-04-24
Read Post
career-opportunities | featured

Career Opportunity - nanoFAB

Apply for a full-time Process Trainer position at the nanoFAB

2025-04-23
Read Post
career-opportunities | featured | news

Career Opportunity - Hyperlume Inc.

Two Front End Process Engineer career opportunities are available at Hyperlume Inc.

2025-03-13
Read Post
fabrication | featured | news

New Die Matrix Expander Available

Improve your dicing post-processing with our new die matrix expander

2024-10-30
Read Post
Diced silicon wafer on a die matrix expander tool
characterization | featured | news

Advanced XRD techniques and applications on Bruker D8D plus diffractometer

Non-Coplanar Scan, Pole Figure, 2D Stress Measurement, and Multi-Angle Scattering

2024-10-01
Read Post
fabrication | featured | news

Optical Emission Interferometry (OEI) in the Plasma-Therm Versaline PECVD

Using endpoint detection in PECVD recipes to improve film thickness accuracy

2024-09-03
Read Post
Graph titled "Endpoint Data" shows an oscillating white line with red and green highlights, likely depicting Optical Emission Interferometry data. The X-axis is time and the Y-axis is smoothed data. A red notation reads "T = λ/(2n)" with a horizontal bracket, possibly showcasing Plasma-Therm analysis.
characterization | featured

Correlative imaging workflow available on SEM/FIB

The nanoFAB is pleased to announce successful configuration and implementation of software solutions in our electron and ion microscopy, enabling large area imaging and correlative workflow.

2024-06-10
Read Post
A magnifying glass focuses on a textured surface with circular insets labeled AFM, SEM, TEM, and EDX, each showcasing unique patterns and colors. The intricate details highlight the power of correlative imaging to unravel complex structures.
fabrication | featured | news

AML Wafer Bonder now available for training

Advanced wafer bonding capabilities are now available using the AML AWB-04

2024-03-28
Read Post
fabrication | featured | news

New Spray Coating Tool Available

Spray coating of photoresist is now available at the nanoFAB

2024-02-02
Read Post
characterization | featured

Advanced TEM Sample Preparation

The ThermoFisher Helios Hydra Plasma FIB offers advanced, damage-free TEM lamella preparation with enhanced flexibility and high throughput for various materials.

2023-10-19
Read Post
characterization | featured

SAXS, GI-SAXS/WAXS are available on Bruker D8D+

The nanoFAB now offers fully commissioned SAXS and GI-SAXS/WAXS techniques on the Bruker D8 DISCOVER Plus X-Ray Diffractometer for user training and sample analysis.

2023-09-21
Read Post
characterization | featured | news

Broad Ion Beam (BIB) polishing for SEM/EDX/EBSD

Automatic, unattended process for large area preparation.

Peng Li
2023-06-03
Read Post
characterization | featured | news

In-situ heating S/TEM is available

The in-situ heating TEM analysis is now available to all users.

Xuehai Tan
2023-03-20
Read Post
fabrication | featured

Kurt J. Lesker 150LX ALD system now open for training

The nanoFAB's newly installed KJLC 150LX Atomic Layer Deposition system is now operational and available for training, offering precise, high-quality atomic-scale film growth.

2022-11-09
Read Post
characterization | featured | news

nGauge AFM is now Available at nanoFAB

AFM by 3 easy steps: Sweep, Approach, and Scan.

Nastaran Yousefi
2022-05-22
Read Post
Close-up of a nGauge AFM microscope examining a small rectangular sample on a metallic stage, illuminated under a focused light.
fabrication | featured | news

AML Wafer Bonder now available for training

Advanced wafer bonding capabilities are now available using the AML AWB-04

fabrication | featured | news

New Spray Coating Tool Available

Spray coating of photoresist is now available at the nanoFAB

fabrication | news

Raith_GDSII toolbox documentation now on Read The Docs

See the new online documentation for the Raith_GDSII MATLAB toolbox

Aaron Hryciw
July 31, 2023
characterization | featured | news

Broad Ion Beam (BIB) polishing for SEM/EDX/EBSD

Automatic, unattended process for large area preparation.

Peng Li
June 3, 2023
characterization | featured | news

nGauge AFM is now Available at nanoFAB

AFM by 3 easy steps: Sweep, Approach, and Scan.

Nastaran Yousefi
May 22, 2023
characterization | featured | news

In-situ heating S/TEM is available

The in-situ heating TEM analysis is now available to all users.

Xuehai Tan
March 20, 2023
characterization | news

Bruker D8D plus XRD-SAXS is Operational

Heating & Biasing; Imaging, Diffraction and EDX

Xuehai Tan
March 5, 2023
characterization | news

Auto Slice & View (ASV) fully commissioned

Fully automatic FIB/SEM tomography

Peng Li
January 10, 2023
1 2 3 5
hello world!