Scanning Electron Microscope (Tescan Vega-3 w/ EDX)


Description

Thermal source inspection SEM and EDX analysis available.

Features

  • Thermal emission source.
  • 200 eV to 30 keV accelerating voltage.
  • 5 axis X, Y, Z, rotational, and tilt stage controls.
  • Low Vacuum and High Vacuum Mode Available
  • EDXS analysis available with 133 eV resolution


Facebooktwittergoogle_pluslinkedinFacebooktwittergoogle_pluslinkedin