NanoIndenter (Hysitron TI 900)

NanoIndenter (Hysitron TI 900)


Automated nanoindenter for lateral force and displacement monitoring for determining Young’s modulus, hardness, fracture toughness, scratch resistance, critical delamination forces and friction coefficients. With top down optics and sub micrometer stage accuracy, precise sampling is achieved. In-situ imaging with indentation tip allows SPM imaging of indented and scratched samples.


  • Capable of indent, scratch and scanning wear testing, with in-situ imaging for SPM topography
  • Complete automation and batch processing for high throughput indentation tests
  • Load resolution is < 1nN with displacement resolution of 0.0004 nm