Bruker XRD D8 Discover


Bruker XRD

Description

D8 Discover diffraction system equipped with Cu-source and high throughput LynxEYE 1-dimensional detector with high intensity and speed compared to point detector. it equipped with centric Eulerian Cradle. The Bruker system is currently only open for powder diffraction applications. It has capability to perform temperature XRD.

Features

  • LynxEye fast scan detector, high resolution, approximately 1/200th of the time required using a point detector, with identical data quality.
  • Temperature controlled sample stage (30 C to 900 C)


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