Fall 2018 Newsletter

Here we provide an update regarding ongoing activities within the nanoFAB which may be of interest to you.

2018 Image Contest

The second annual nanoFAB image contest is now open! Submissions are due by November 30. Full details and available prizes available on our website. Keep Reading Previous winners can be found here.

Advanced Ion Milling

Our newly installed Leica Ar Ion Milling System is commissioned and available for general access. Large area SEM, high quality TEM and gentle polishing sample preparation is now available. Examples of Work

Thermal Oxide Calculator

As part of the nanoFAB Toolbox initiative, we are pleased to publish a thermal oxide calculator.
Keep Reading

Did you know?

The nanoFAB Field Emission SEM tip lasted 34,371 hours before needing a tip change. This was the first tip change in 4 years.

Save the Date

The nanoFAB will be hosting a User Community Meeting on
Tuesday December 11th.
All will be welcomed to discuss applications and operational needs.
Further details will be posted shortly.