Webinar: A micron wide and ten angstroms deep: Metrology and Materials Characterization
Wednesday, July 22, 2015
12:00 p.m. – 1:00 p.m. MDT
The nanoFAB invites you to attend a webinar hosted by CMC Microsystems, the third in the 2015 series for FACT Services (Fabrication, Assembly, Characterization, Test), which focuses on service capabilities in materials characterization and metrology. Materials characterization experts will present service capabilities in microscopy, spectroscopy, electronic characterization, elemental analysis, microstructural metrology, and more. Learn how to tap into our expertise for your R&D needs.
Want to hear about a specific topic? Looking for a specific capability? Send your questions in advance to firstname.lastname@example.org.
FACT Services delivers results for academic and commercial clients using expertise and toolsets in a network of service-ready university nanofabrication labs across Canada. FACT Services will create a dedicated project to meet custom fabrication needs, including engineering consultation, process development, characterization, and early-stage production.
Edward Xu, Technical Manager of the Pratt Microfabrication Facility at the Toronto Nanofabrication Centre (TNFC) at University of Toronto.
Marie-Josée Gour, Manager of External Services at Institut interdisciplinaire d’innovation technologique (3IT) Nano lab, Université de Sherbrooke.
Aaron Hryciw, Fabrication Group Manager at the University of Alberta’s nanoFAB.
Alireza Mesgar, Research Associate with the Microfabrication Laboratory (LMF) of the Thin Films Group (GCM) at Polytechnique Montréal.
(moderator) Andrew Fung, Client Technology Advisor, Microsystems and Nanotechnology at CMC Microsystems in Kingston.
Learn more about FACT Services.