Surface Metrology Workshop for Advanced Characterization for Nanotechnology, O&G with Live Demonstration of Dimension FastScan AFM
November 19th – 20th | University of Alberta, CME, Nano-interfaces and Molecular Engineering Group. NINT- 1st Floor, Taylor Room, 11421 – Saskatchewan Drive, NINT Building
Bruker Nano Surfaces in collaboration with Nano-interfaces and Molecular Engineering Group is proud to announce a technology presentation of the Dimension FastScan AFM, with emphasis on advanced characterization in nanotechnology, and oil & gas applications. During this 2-day workshop, we will present the latest technological advances for increased data collection on Bruker’s AFM with self-sensing, unattended AFM technology.
For more information, click here.
Seats are limited, please R.S.V.P. to steve@sfr.ca
System demonstration and sample measurement is on a first come, first serve basis