Surface Metrology (AFM) Workshop – November 19 & 20, 2013

Surface Metrology Workshop for Advanced Characterization for Nanotechnology, O&G with Live Demonstration of Dimension FastScan AFM

Bruker Nano Surfaces in collaboration with Nano-interfaces and Molecular Engineering Group is proud to announce a technology presentation of the Dimension FastScan AFM, with emphasis on advanced characterization in nanotechnology, and oil & gas applications. During this 2-day workshop, we will present the latest technological advances for increased data collection on Bruker’s AFM with self-sensing, unattended AFM technology.

For more information, click here.

Seats are limited, please R.S.V.P. to
System demonstration and sample measurement is on a first come, first serve basis

R.S.V.P. Now